About 4 years ago, I read a post on the Internet that basically said that if you raised the voltage on a CPU and left it for that way over night while running CPU-intensive programs, it would overclock better. The author had a detailed arguement for while this would be the case, and the description was well thought out and made sense... except that it's incorrect on one fundamental point. This post has since made it's way around the internet and it is frequently a source of debate on overclocking websites as to whether or not it's true.
The author has a website with a description and several times over the years I have contacted the author and we've had a fairly lively debate over the issue, but I have never been able to convince him that he is mistaken.
I came across another discussion of whether "burn-in" helps a CPU in the CPU forum this last week and a search on Google shows that the website with the advice on "CPU conditioning" is the first entry at Google. The author's website is here. Most of the page is pretty factual and it's obvious that the author has a decent grasp of semiconductor device physics.
The bit that I strongly disagree with is:
There are several problems with this section and they all stem from one misconception and that is whether hot-electrons can be trapped in the gate oxide of a PMOS device under normal operation conditions. The issue is whether electrons - which are the minority carrier in a PMOS device - could be generated in the channel and then get "sucked" into the gate oxide where they would reside adding negative charge to the gate and thus improving the Vt of the device.
The problem with this scenario is that electrons are negatively charged. In order to form and maintain an inversion layer for conduction in a PMOS device, you need a negative voltage on the gate and a positive voltage on the substrate. In this case, any electrons generated will be repelled away from the negatively biased gate and will be "sucked" into the positively charged substrate.
When I mentioned this to the author of the webpage, he cited a technical paper about embedding electrons in the gate of a PMOS device and used the results which show the benefits of hot-e on PMOS Vt, but the problem with this particular article is that the author of the article deliberately reverse biased the PMOS gate in order to create the condition. I readily agree that if electrons get trapped in the gate, that the Vt improve improving the IDsat of the gate... my issue is that the biasing on the gate on a real CPU precludes this condition outside of a labratory.
This article on this webpage is used as an authoritative source for information on "conditioning". I have tried to convince the author that he is mistaken. I think it would be a benefit to the internet as a whole if other who are knowledgeable on the subject chimed in as well. The author seems to be a reasonable person and I think that if others explained the misconception that the page might be changed.
The author has a website with a description and several times over the years I have contacted the author and we've had a fairly lively debate over the issue, but I have never been able to convince him that he is mistaken.
I came across another discussion of whether "burn-in" helps a CPU in the CPU forum this last week and a search on Google shows that the website with the advice on "CPU conditioning" is the first entry at Google. The author's website is here. Most of the page is pretty factual and it's obvious that the author has a decent grasp of semiconductor device physics.
The bit that I strongly disagree with is:
One effect that occurs during the actual using of the transistors is the hot-electron-degradation of the gateoxide. Hot electron degradation occurs, when electrons are accelerated to energy levels which allow them to cross the barrier of the gateoxide. The electrons would then either cross the gateoxide completely or get stuck within the gateoxide. A stuck electron would incorporate a negative charge into the gateoxide.
This degradation starts as soon as the transistor is used and will eventually lead to the failure of it. Usually, the CPUs are designed to last almost forever. If you can live without that (who wants to use a lame 500 in 20 years anyway?), you can actually make use of this degradation for your overclocking.
The fun part of this kind of degradation is, that regarding to speed, it makes 50% of the transistors in your CPU a bit worse, but the other 50% would get much better.
This is because there are two different flavours of transistors in the CMOS process, NMOS and the complementary PMOS. If your gateoxide has incorporated negative charge in it, the NMOS would get a slacker swing, the PMOS swing on the contrary, would become steeper. Thus, the PMOS usually being the speedlimiting factor, the CPU at whole, which consists of NMOS and PMOS transistors, would be able to run faster.
However, the physical effects are not yet understood completely. And that applies not only to me...
There are several problems with this section and they all stem from one misconception and that is whether hot-electrons can be trapped in the gate oxide of a PMOS device under normal operation conditions. The issue is whether electrons - which are the minority carrier in a PMOS device - could be generated in the channel and then get "sucked" into the gate oxide where they would reside adding negative charge to the gate and thus improving the Vt of the device.
The problem with this scenario is that electrons are negatively charged. In order to form and maintain an inversion layer for conduction in a PMOS device, you need a negative voltage on the gate and a positive voltage on the substrate. In this case, any electrons generated will be repelled away from the negatively biased gate and will be "sucked" into the positively charged substrate.
When I mentioned this to the author of the webpage, he cited a technical paper about embedding electrons in the gate of a PMOS device and used the results which show the benefits of hot-e on PMOS Vt, but the problem with this particular article is that the author of the article deliberately reverse biased the PMOS gate in order to create the condition. I readily agree that if electrons get trapped in the gate, that the Vt improve improving the IDsat of the gate... my issue is that the biasing on the gate on a real CPU precludes this condition outside of a labratory.
This article on this webpage is used as an authoritative source for information on "conditioning". I have tried to convince the author that he is mistaken. I think it would be a benefit to the internet as a whole if other who are knowledgeable on the subject chimed in as well. The author seems to be a reasonable person and I think that if others explained the misconception that the page might be changed.