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OAK RIDGE, Tenn., Sep. 17, 2004 ? Oak Ridge National Laboratory researchers, using a state- of-the-art microscope and new computerized imaging technology, have pushed back the barrier of how small we can see--to a record, atom-scale 0.6 angstrom. ORNL, a Department of Energy national laboratory, also held the previous record, at 0.7 angstrom.
As reported in the Sept. 17, 2004, issue of the journal Science, researchers obtained the improved resolution with ORNL's 300-kilovolt Z-contrast scanning transmission electron microscope (STEM), aided by an emerging technology called aberration correction. The direct images have been acknowledged as proof of atom-scale resolution below one angstrom and provide researchers with a valuable tool for designing advanced materials.
"Looking down on a silicon crystal, we can see atoms that are only 0.78 angstroms apart, which is the first unequivocal proof that we're getting subangstrom resolution. The same image shows that we're getting resolution in the 0.6 angstrom range," said ORNL Condensed Matter Sciences Division researcher Stephen Pennycook.
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As reported in the Sept. 17, 2004, issue of the journal Science, researchers obtained the improved resolution with ORNL's 300-kilovolt Z-contrast scanning transmission electron microscope (STEM), aided by an emerging technology called aberration correction. The direct images have been acknowledged as proof of atom-scale resolution below one angstrom and provide researchers with a valuable tool for designing advanced materials.
"Looking down on a silicon crystal, we can see atoms that are only 0.78 angstroms apart, which is the first unequivocal proof that we're getting subangstrom resolution. The same image shows that we're getting resolution in the 0.6 angstrom range," said ORNL Condensed Matter Sciences Division researcher Stephen Pennycook.
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