Engineer
Elite Member
By the way, OCZ's version is in Beta and should be released soon. It will combine garbage collection as well as TRIM and should have the same improvements as those listed below. The Crucial version has had very good reviews with positive results from their forum postings.
Change log...
Release Notes for Firmware 1916
Crucial's version
SuperTalent Ultradrive versions
Change log
Change log...
Release Notes for Firmware 1916
Crucial's version
* Fixed issue that sometimes causes firmware download problem
* Fixed issue that could cause 256GB to be corrupted
* Eliminated performance degradation over time with Wiper with 1819 FW
* Fixed issue where the power cycle count was incorrectly being reported with 1819 FW
* Fixed issue where some SATA 1 hosts weren’t correctly identifying the hardware
* Fixed issue found in simulation (not in the field) where the free block count was incorrectly being reported
* Fixed issue with remaining life not being properly displayed on SMART information
* Added support for additional NAND manufactures and capacities
* Made further improvements to wear leveling algorithm
SuperTalent Ultradrive versions
Change log
Release Date: 1/4/10
Serial Numbers: xxxxxxx‐xIBx/xICx/xIDx‐xxxxxxx
Change Log:
‐ Feature Add: Garbage Collection enabled
‐ Feature Add : Firmware download through SCSI interface
‐ Bug Fix: Early performance drop issue in quite clean state. This problem is fixed with changing
weak dynamic wear leveling parameter
‐ Bug Fix: Occasional firmware download failure bug fixed (Due to FPDMA problem of
SCSI/AHCI)
‐ Bug Fix: IRQ stack overflow bug fixed. Runtime bad block structure was too big. It caused
256GB block 0 to be corrupted.
‐ Bug Fix: With 1819 firmware, Wiper performance was slower than 1571 firmware revision.
‐ Bug Fix: Power cycle count was always 0 in 1819 firmware.
‐ Bug fix: Specific SATA Gen I host (ex. SB400) caused SATA hardware buffer ID error.
‐ Bug Fix: L63B (256 pages/block) wear leveling bug fixed.
‐ Bug Fix: Bug fix found during simulation. Free block count may become 0 after a lot of power
cycling. It was not witnessed in the real life.
‐ Bug Fix: SMART information – Remaining life was not 100% even right after firmware
download.
‐ Bug Fix: Flush should not check IDNF.
‐ Other: Toshiba NAND has additional blocks over 4095th block. These blocks can be used.
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‐ Other: For Intel/Micron 34nm NAND, NAND BIST is performed always. NAND BIST is flash cell
test. It uses AA5555AA pattern and uses 2 plane mode.
‐ Other: To support Intel/Micron 34nm NAND, copy back delay was adjusted.
‐ Other: Erase count distribution is made better.